Conference Publication Details
Mandatory Fields
Egan, P; Lakestani, F; Whelan, MP; Connelly, MJ
Interferometry XIII: Techniques and Analysis
Novel techniques for random depth access three-dimensional white-light optical metrology - art. no. 629212
2006
Published
0
()
Optional Fields
white-light interferometry three-dimensions random access functional machine vision PUNCH TEST ROUGH SURFACES FULL-FIELD INTERFEROMETRY PROFILER BEHAVIOR
29212
29212
10.1117/12.678061
Grant Details