Conference Publication Details

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Authors

Mullane B., O'Brien V., MacNamee C., Fleischmann T.

Conference Title

International Test Conference, (ITC)

Title of Paper

A2DTest: A complete integrated solution for on-chip ADC self-test and analysis

Year

2009

Month

November

Status

Published

Peer Reviewed

1

Times Cited

()

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End Date

Abstract

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URL

DOI Link

10.1109/TEST.2009.5355722

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