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Conference Paper
Mullane, Brendan,MacNamee, Ciaran,O'Brien, Vincent,Fleischmann, Thomas
2009
A Low Cost On-Chip Design Platform for Static ADC Measurments. European Test Symposium, 2009. ETS '09. 14th IEEE
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data compression fault simulation integrated circuit testing LFSR reseeding forms defect coverage linear equations seed-selection method test compression transition faults
1530-18771530-1877
125
130
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