Mandatory Fields

Authors

Mullane, B.,O'Brien, V.,MacNamee, C.,Fleischmann, T.

Conference Title

A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. Test Conference, 2009. ITC 2009. International

Title of Paper

Year

2009

Month

Status

Published

Peer Reviewed

Times Cited

()

Optional Fields

Search Keyword

analogue-digital conversion built-in self test A2DTest onchip ADC self-test onchip BIST solution onchip hardware resources

Editors

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End Page

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End Date

Abstract

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