Conference Paper

O'Brien, Vincent,Mullane, Brendan,Fleischmann, Thomas,MacNamee, Ciaran

2009

A High Precision Analog Signal Generator Design for ADC BIST. European Test Symposium, 2009. ETS '09. 14th IEEE

Author

Published

()

data compression fault simulation integrated circuit testing LFSR reseeding forms defect coverage linear equations seed-selection method test compression transition faults

1530-18771530-1877

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