Higgins, M.,MacNamee, C.,Mullane, B.

2010

Computers & Digital Techniques, Ietcomputers & Digital Techniques, Iet

Design and implementation challenges for adoption of the IEEE 1500 standard

Published

()

IEEE standards design for testability logic design system-on-chip IEEE 1500 standard TAM architecture embedded core test on-chip system bus physical interconnection parallel port reusable wrapper architecture serial port test access mechanism test access port test controller wrapper instruction register

4

11

38

49

1751-86011751-8601