Mandatory Fields

Authors

Mullane B., MacNamee C., O'Brien V., and Fleischmann T.

Conference Title

IEEE European Test Symposium, (ETS)

Title of Paper

A Low Cost On-Chip Design Platform for Static ADC Measurments

Year

2009

Month

May

Status

Published

Peer Reviewed

Times Cited

()

Optional Fields

Search Keyword

Analog to Digital Converter Built in Self Test (BIST) System on Chip

Editors

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End Page

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Abstract

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URL

DOI Link

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