Peer-Reviewed Journal Details
Mandatory Fields
Gaburro R.;Nolan C.
2008
January
Inverse Problems And Imaging
Enhanced imaging from multiply scattered waves
Published
()
Optional Fields
Microlocal analysis Multiple scattering SAR
2
2
225
250
© 2008 American Institute of Mathematical Sciences. Many imaging methods involve probing a material with a wave and observing the back-scattered wave. The back-scattered wave measurements are used to compute an image of the internal structure of the material. Many of the conventional methods make the assumption that the wave has scattered just once from the region to be imaged before returning to the sensor to be recorded. The purpose of this paper is to show how this restriction can be partially removed and also how its removal leads to an enhanced image, free of the artifacts often associated with the conventionally reconstructed image.
1930-8337
10.3934/ipi.2008.2.225
Grant Details